Equipment Equipment

The Structural Analysis Suite comprises of specialist instrumentation allowing the investigation into the size and morphology of particles, the crystalline structure of materials and atomic quantification of materials at microscopic levels.

The Environmental Analysis Laboratory experienced technical staff is able to provide an analytical service in handling samples from the atmosphere, geosphere, hydrosphere and industry.

This service is available to the University Of East Anglia (UEA), the Norwich Research Park (NRP) and the wider scientific and business community in the UK and abroad.

We offer a complete analytical package, from sampling and preparing to analysing and reporting results.

When required we can train personnel in the analytical techniques associated with their samples, including preparation and instrument control.  Once trained, users can book the instruments to carry out their own research and analysis.

All enquiries are also welcome and should initially be addressed to Liz Rix, Facilities Manager E.Rix@uea.ac.uk 01603 592540

We have the following equipment available for use

X-ray Fluorescence Spectrometer

The Bruker AXS S4 Pioneer is a sequential X-ray Fluorescence Spectrometer designed for qualitative, semi-quantitative and quantitative elemental analysis of solids, liquids or powders.

With limits of detection as low as 1 to 3 ppm for a range of elements, it is a fast and efficient tool for analysis of trace elements.

The S4 Pioneer is also ideally suited for major elements quantification.

The elemental spectrum of detection ranges from light elements, such as fluorine or sodium up to heavier elements such as thorium or uranium.

X-ray Diffractometer

Thermo Scientific ARL XTRA Powder Diffractometer features a copper X-ray tube and a goniometer system providing resolution in the low angle region where peaks can be observed down to 0.5°.
The solid state Peltier cooled Si(Li) detector provides a high-performance instrument for high quality powder diffraction applications including chemicals, pharmaceuticals, polymers, semiconductors, thin films, metals and minerals.
 

X-ray diffraction can measure sub-nanometric structural characteristics of materials. It can also differentiate two crystalline samples with identical composition but different structure (diamond and graphite, calcite and aragonite, etc.)

Scanning Electron Microscope (SEM) with Energy Dispersive Spectrometer (EDS)

The JSM 5900 LV is a Scanning Electron Microscope manufactured by JEOL Ltd (Japan). It is fitted with a tungsten filament. Topographic and chemically contrasted images can be produced. Samples can be observed without the need for coating by using the low vacuum (LV) capability of the instrument. Large samples can be accommodated by the 5-axis stage (X, Y, Z, rotation, tilt).

Attached to the SEM is an INCA EDS elemental analyser, developed by Oxford Instruments. The EDS allows for elemental identification, elemental x-ray mapping and atomic quantification at microscopic level.

This combination offers advanced capabilities in the field of microscopic characterisation.

The Laboratory is also equipped with Polaron SC7640 gold and Polaron CC7650 carbon sputter coaters to allow for high resolution and high vacuum observation and analysis.

High-quality polarization microscope

The Leica DM2500 P is a high quality and high resolution polarization microscope ideally suited for rock thin sections or pharmaceutical samples.

It is fitted with a Leica IC D digital camera. Maximum image resolution is 2088x1550 pixels.

Magnification ranges from 25x to 400x. Objectives are: N plan 2.5x POL/, Hi plan 4x POL, Hi plan 10x POL, 20x POL and HCX PL Fluoter 40x combined with HC plan 10x BR.M POL eyepieces. 

Transmitted and reflected lights are available. There is also a mercury vapour short arc lamp as an extra transmitted light source.

The software installed for live observation, picture acquisition and post-treatment is Leica Application Suite v2.5.0.