The Structural Imaging Platform comprises of specialist instrumentation allowing the investigation into the size and morphology of particles, the crystalline structure of materials and atomic quantification of materials at microscopic levels.


We have the following equipment available for use:

Scanning Electron Microscope (SEM)

A state-of-the-art Zeiss Gemini 300 SEM with a Quorum Technologies cryo system, an Oxford Instruments EDS and STEM and Inlens detectors. The Gemini 300 can operate at low vacuum (5 to 500Pa in VP mode and 5 to 150Pa in NanoVP mode) with dedicated VP SE and VP BSD detectors. Low voltage (1kV) resolution is 1nm and at high voltage (15kV) resolution can be as low as 0.8nm.

The Gemini 300 offers great imaging flexibility for a wide range of samples and applications, from material to life science, at high and low pressure, for both conductive and non-conductive samples.

Transmission Electron Microscope (TEM)

A JEOL 2010 200 kV Transmission Electron Microscope offers high resolution TEM imaging services. TEM allows high magnification imaging of a wide range of specimens and thereby provides solutions to diverse problems in materials, nanoscience, and biological sciences including:

  • characterization of nanoparticles and nanoscale structures
  • investigation of drug delivery systems
  • high resolution structural studies
  • visualisation of cell and tissue structure and sub-cellular ultrastructure

Atomic Force Microscope (AFM)

AFM is a very-high-resolution type of scanning probe microscopy with resolution in the order of fractions of a nanometer, which is more than 1000 times higher than the optical diffraction limit.


All enquiries are welcome and should initially be addressed to Antony Hinchliffe, Instrument Platform Manager:

Academic Lead: Prof Michael Wormstone

Support Lead: Bertrand Lézé